Berlin 2018 – wissenschaftliches Programm
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 27: Postersession KFM
KFM 27.21: Poster
Donnerstag, 15. März 2018, 15:00–17:00, Poster E
X-ray emission spectroscopy (XES) by an X-ray tube based laboratory spectrometer — •Richard Gnewkow1, Christopher Schlesiger1, Daniel Grötzsch1, Lars Anklamm2, Fabian Kowalewski3, Serena DeBeer3, Wolfgang Malzer1, and Birgit Kabbgießer1 — 1Institute for Optic and Atomic Physics, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin, Germany — 2Institut für angewandte Photonik e. V. (IAP), Rudower Chaussee 29/3, 12489 Berlin, Germany — 3Max Planck Institute for Chemical Energy Conversion, Stiftstr. 34 - 36, 45470 Mülheim a.d. Ruhr, Germany
X-ray emission spectroscopy (XES) is an upcoming method for the investigation of the electronic structure of chemical compounds. Typically the chemical shift of the Kβ-multiplett is analyzed. XES, therefore, requires a high spectral resolution and is mainly performed at synchrotron facilities.
We developed an X-ray tube based laboratory spectrometer for XES experiments. The dispersive element is a graphite mosaic crystal called Highly Annealed Pyrolytic Graphite (HAPG) in an adapted von Hamos geometry. The full cylinder optic combines high efficiency with a spectral resolving power of E/ΔE = 4000 for an energy range between 2 keV - 10 keV. The use of a polycapillary lens allows the analysis on a micrometer scale.
In this contribution, we will present the setup of the spectrometer and its properties. We will show results for the Kβ diagram line and valence-to-core region for thin and diluted samples, e.g. catalysts.