Berlin 2018 – wissenschaftliches Programm

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 27: Postersession KFM

KFM 27.25: Poster

Donnerstag, 15. März 2018, 15:00–17:00, Poster E

Analysis of Multilayer Zone Plates (MZP) for Imaging with hard X-Rays and Nanometer Resolution — •Jakob Soltau, Lars Melchior, Tim Salditt, and Markus Osterhoff — Institut für Röntgenphysik, Georg-August-Universität Göttingen, Göttingen, Germany

The brilliance of modern synchrotrons cleared the path towards generating highly focussed x-ray beams. While focal spot diameters of a few nanometers are already common at lower x-ray energies (< 10 keV), there is a lack of x-ray optics suited for scanning microscopy with small spot sizes at higher energies. The challenge for manufacturing zone plates in the hard x-ray energy range is the high aspect ratio, defined by the large optical thickness (>5 μm) - needed due to the low interaction between photons and matter - and small zone widths (<10 nm) [1]. The propagation of electromagnetic waves in structures not much larger than their wavelength and with high-aspect ratios lead to effects as waveguiding and dynamical diffraction. To assess these effects and characterize the efficiency of multilayer zone plates (MZP) 3D finite-differences simulations [2] have been performed. The simulation of the electromagnetic fields inside and behind the MZP showed the advantage of circular MZPs to achieve very high photon flux densities in a single focal point of 5 nm diameter. Furthermore the simulations were revealing interaction processes like e.g. dynamical diffraction inside the MZPs. [1] C. Eberl et al. Fabrication of laser deposited... In: Applied surface science 307 (2014) [2] L. Melchior et al. Finite difference methods for... In: Opt. Express (accepted)