Berlin 2018 –
wissenschaftliches Programm
KFM 7: Microstructure of thin films / TEM-based Nanoanalysis
Montag, 12. März 2018, 15:00–18:20, E 124
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15:00 |
KFM 7.1 |
Scanning Transmission Helium Ion Microscopy on 1nm Thick Carbon Nanomembranes — •Daniel Emmrich, Annalena Wolff, André Beyer, and Armin Gölzhäuser
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15:20 |
KFM 7.2 |
Self-assembly of organic semiconducting material at the liquid-liquid interface — •Manuel Johnson, Tim Hawly, and Rainer H. Fink
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15:40 |
KFM 7.3 |
Vibrational fingerprints of lithium niobate on insulator and technological aspects for domain inversion in z-cut LiNbO3 thin films — •Peter Mackwitz, Michael Rüsing, Kai Spychala, Minglong Zhai, Hui Hu, Gerhard Berth, and Artur Zrenner
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16:00 |
KFM 7.4 |
Dopant distribution and octahedral distortions at superconducting complex oxide bilayer interfaces — Y. Eren Suyolcu, Yi Wang, •Wilfried Sigle, Federico Baiutti, Georg Cristiani, Joachim Maier, Gennady Logvenov, and Peter A. van Aken
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16:20 |
KFM 7.5 |
A study on Amorphous Silicon Films using SAXS and SANS to distinguish nano-crystals from voids. — •Eike Gericke, Armin Hoell, Jimmy Melskens, Dragomir Tatchev, Uwe Keiderling, Robert Wendt, Simone Raoux, Klaus Rademann, and Klaus Lips
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16:40 |
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20 min. break
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17:00 |
KFM 7.6 |
The contribution has been withdrawn.
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17:20 |
KFM 7.7 |
Generation of Attosecond Electron Pulse Trains for Ultrafast Transmission Electron Microscopy — •Christopher Rathje, Katharina E. Priebe, Sergey V. Yalunin, Armin Feist, Thorsten Hohage, Sascha Schäfer, and Claus Ropers
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17:40 |
KFM 7.8 |
Model-based geometry reconstruction of quantum dots from TEM — •Anieza Maltsi, Thomas Koprucki, Karsten Tabelow, and Tore Niermann
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18:00 |
KFM 7.9 |
Structural properties of InGaAs Quantum dots investigated by Transmission Electron Microscopy — •Laura Meißner, Tore Niermann, and Michael Lehmann
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