Berlin 2018 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 9: Magnetic domain walls
MA 9.8: Vortrag
Montag, 12. März 2018, 17:00–17:15, EB 202
Scanning Reflection X-ray Microscope (SRXM) - a new tool for magnetic domain imaging — •Andreas Schümmer1, Hans-Christoph Mertins1, Roman Adam2, Claus Schneider2, Larissa Juschkin3, and Ulf Berges4 — 1University of Applied Sciences Münster, 48565 Steinfurt, Germany — 2Forschungszentrum Jülich,52428 Jülich, Germany — 3Rhein Westfälische Technische Hochschule Aachen, 52062 Aachen, Germany — 4TU Dortmund, Zentrum für Synchrotronstrahlung, 44227 Dortmund, Germany
We present the first results of the newly developed scanning reflection x-ray microscope (SRXM) operating in the extreme ultraviolet (EUV) spectral range. Focus lies on the mechanical setup, efficient fabrication process of zone plate optics and first results in structural and element-selective imaging. The SRXM is dedicated for imaging of magnetic domains in buried layers exploiting magneto-optical reflection spectroscopy in T-MOKE, or for XMCD [1] under incidence angles from 20° to 60°. The advantage of working in the EUV region is the access to the 3p absorption edges of 3d transition metals. In addition, the intensity of reflected light is about two orders of magnitude higher than at the 2p edges. [1] M. Tesch, M. Gilbert, H-Ch. Mertins, D. Bürgler et al., Appl. Opt.52, 4294 (2013)