Berlin 2018 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 47: Poster Session II

MM 47.46: Poster

Mittwoch, 14. März 2018, 18:30–19:45, Poster C

New simulation method of segmented ring detector images in scanning transmission electron microscopy (STEM) analyzing medium-range order — •Sven Hilke, Jan Kirschbaum, Vitalij Hieronymus-Schmidt, Manuel Radek, Hartmut Bracht, Gerhard Wilde, and Martin Peterlechner — University of Münster, Institute of Materials Physics, Wilhelm-Klemm-Str. 10, 48149 Münster

The medium-range structure of amorphous solids at the nanometer scale is an important information for their mechanical behavior and for relaxation processes. We present in this work a new method to extract Fluctuation Electron Microscopy (FEM) normalized variance profiles - one normally gains from experimental nano-beam diffraction pattern (NBDP) - by image simulations of segmented ring detectors using STEMcl [1]. To discuss this new approach we compared experimental normalized variance profiles with the simulated ones. The segmented detector simulation and analysis of molecular dynamics (MD) simulated structures are in good agreement with the experimental data - in terms of peak position as well as peak shape in the normalized variances. These results indicate the viability of the simulation approach and opens the possibility to study e.g. small structural heterogeneities by simulations and experiments.

[1]Radek, M.; Tenberge, J.-G.; Hilke, S.; Wilde, G.; Peterlechner, M.; Ultramicroscopy (2017), submitted.