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O: Fachverband Oberflächenphysik
O 29: Metallic nanowires on semiconductor surfaces
O 29.11: Talk
Tuesday, March 13, 2018, 13:00–13:15, MA 144
Optical characterization of rare-earth silicide nanostructures on vicinal Si(001) — •Sandhya Chandola1, Eugen Speiser1, Norbert Esser1, Stephan Appelfeller2, Martin Franz2, and Mario Dähne2 — 1Leibniz-Institut für Analytische Wissenschaften ISAS e.V., Berlin, Germany — 2Institut für Festkörperphysik, Technische Universität, Berlin, Germany
Rare-earth metals can interact strongly with Si(001) surfaces to form different types of silicide nanostructures such as wetting layers, nanowires as well as bundles of nanowires. Reflectance anisotropy spectroscopy (RAS) is used to monitor optically the growth evolution of Tb and Dy silicide nanostructures on vicinal Si(001) surfaces while STM is used to analyze their structural properties so as to directly relate the spectral signatures in RAS to the structural features. It is shown that the optical signatures of the different types of silicide nanostructures can be distinguished quite clearly with RAS due to their distinctive electronic properties associated with the structural units as observed with STM.