Berlin 2018 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 80: Poster: Scanning Probe Techniques - Method Development
O 80.6: Poster
Mittwoch, 14. März 2018, 18:15–20:30, Poster A
Four-point probe measurements using current probes with voltage feedback to measure electric potentials — •David Cuma1,2, Felix Lüpke1,2, Stefan Korte1,2, Vasily Cherepanov1,2, and Bert Voigtländer1,2 — 1Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany — 2JARA-FIT, 52425 Jülich, Germany
Four-point probe sensing is a widespread measurement technique to determine electrical impedances. The underlying idea is to separate current injection and voltage sensing probes to eliminate the influence of distorting contact resistances. Among others, the technique is commonly utilized in multi-tip scanning tunneling microscopy setups (see e.g. [1]). The necessity to perform both voltage and current measurements, however, requires either impracticable rewiring in between measurements or complex electronics, which can perform both measurements but are prone to induce additional electrical noise. By using current sensing probes to measure the voltage via a feedback loop [2] we introduce a new approach that allows to conduct low noise and in principle truly non-invasive four-point probe measurement at the nanometer scale.
[1] S. Just, M. Blab, S. Korte, V. Cherepanov, H. Soltner, and B. Voigtländer, Phys. Rev. Lett. 115, 066801 (2015)
[2] F. Lüpke, S. Korte, V. Cherepanov, and B. Voigtländer, Rev. Sci. Instr. 86, 123701 (2015)