Berlin 2018 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 69: Multiferroic Oxide Thin Films and Heterostructures II (joint session KFM/TT/MA)
TT 69.2: Vortrag
Mittwoch, 14. März 2018, 15:30–15:45, EMH 225
Real-time observation of polarization emergence in ultrathin ferroelectric heterostructures — •Gabriele De Luca1, Nives Bonacic1, Johanna Nordlander1, Corinne Bouillet2, Manfred Fiebig1, and Morgan Trassin1 — 1Department of Materials, ETH Zurich, Vladimir-Prelog-Weg 4, 8093, Zurich, Switzerland — 2Institut de Physique et Chimie des Matériaux de Strasbourg CNRS UMR 7504, 67034, Strasbourg, France
The integration of functional properties into oxide multilayer architectures demands for atomic precision. In-situ diagnostic tools guarantee high structural quality but are usually insensitive to the functionality targeted with the actual deposition. The conventional optimization process requires multiple samples and ex-situ analysis. Here, we take advantage of the non-invasive nature of optical probes and monitor the functionality during growth. Taking ferroelectricity as a representative case, we show that optical in-situ second harmonic generation (ISHG) analysis can be performed simultaneous to the pulsed-laser-deposition growth operation. We follow the evolution of the spontaneous polarization in real time and with monolayer resolution throughout the deposition process [1]. Such direct access allows validating the growth of oxide heterostructures with an arbitrary sequence of up- and down-polarized ferroelectric layers. This is only the first step in the implementation of ISHG as a growth diagnostic tool. The in-situ access to emerging properties enables an unprecedented degree of control that can promote the engineering of oxides functionalities to a completely new level.
[1] G. De Luca et al., Nat. Commun. 8, 1419 (2017)