Erlangen 2018 – wissenschaftliches Programm

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K: Fachverband Kurzzeit- und angewandte Laserphysik

K 1: Optical Methods - EUV and x-ray Sources

K 1.3: Vortrag

Montag, 5. März 2018, 14:55–15:10, MB HS

Ptychographic Wavefront Measurement of a High Harmonic Seeded Soft X-ray Laser — •Michael Zürch^1,2,3, Frederik Tuitje¹, Tobias Helk¹, Julian Gautier⁴, Fabian Tissandier⁴, Jean Philippe Goddet⁴, Stephane Sebban⁴, and Christian Spielmann^1,2 — ¹Institute of Optics and Quantum Electronics, Abbe Center of Photonics, Jena University, Jena, Germany — ²Helmholtz Institute Jena, Jena, Germany — ³Department of Chemistry, University of California, Berkeley, CA 94720, USA — ⁴LOA, ENSTA, CNRS, Ecole Polytechnique, Universite Paris-Saclay, F-91762 Palaiseau cedex, France

Soft X-ray lasers (SXRL) are intense sources of quasi-monochromatic coherent short wavelength radiation with pulse durations of about 1 ps in a table top scheme. The beam quality of a SXRL can be significantly enhanced by seeding the X-ray amplifier with a laser-driven high harmonic generation (HHG) source. Here, we employ ptychographic coherent diffraction imaging for nanoscale imaging as well as measuring the complex-valued illumination function of a HHG-seeded SXRL operating at 32.8 nm wavelength with high fidelity. Backpropagation of the field allows determining source properties in unprecedented quality. We find that HHG seeding results in excellent spatial coherence properties, while a high degree of temporal coherence is maintained through the narrow-band amplification. The results suggest that HHG-seeded SXRL are combining high photon flux (>10¹² photons/shot) with excellent spatial and temporal coherence properties rendering it an ideal source for high resolution coherent X-ray imaging.