Erlangen 2018 – wissenschaftliches Programm
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Q: Fachverband Quantenoptik und Photonik
Q 45: Precision Spectroscopy V - highly charged ions (joint session A/Q)
Q 45.5: Vortrag
Mittwoch, 7. März 2018, 15:00–15:15, K 1.016
Electronic transitions in highly charged ions as X-ray wavelength standards — •Sven Bernitt1,2, Steffen Kühn2, René Steinbrügge3, Hans-Christian Wille3, Thomas Stöhlker1,4, and José R. Crespo López-Urrutia2 — 1IOQ, Friedrich-Schiller-Universität, Jena, Germany — 2Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 3Deutsches Elektronen-Synchrotron, Hamburg, Germany — 4Helmholtz-Institut Jena, Germany
The newest generations of synchrotron and free-electron laser light sources combined with high resolution monochromators offer high X-ray photon fluxes over narrow bandwidths. This allows for a wide range of new applications, among others in material science, biophysics, laboratory astrophysics, and fundamental atomic physics. However, currently most experiments have to rely on crystallographic standards or absorption edges measured in macroscopic samples for the calibration of X-ray wavelengths, which limits the achievable accuracies. Electronic transitions in few-electron highly charged ions can serve as reliable high-precision alternative X-ray wavelength standards. We have developed PolarX-EBIT, a compact electron beam ion trap with a novel off-axis electron gun. It allows to measure resonantly excited fluorescence of highly charged ions interacting with X-rays without blocking the photon beam, therefore allowing wavelength calibration simultaneous with arbitrary downstream experiments. We present the new trap as well as the results of an experiment where it was used to provide an accurate calibration of the photoabsorption of various gases relevant for the interpretation of astropysical X-ray spectra.