Würzburg 2018 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 41: Halbleiterdetektoren / Strahlenhärte I

T 41.1: Vortrag

Dienstag, 20. März 2018, 16:30–16:45, Z6 - SR 2.010

Direct Measurement of Optical Cross-Talk in SiPMs Using Light Emission Microscopy — •Derek Strom, Razmik Mirzoyan, and Jürgen Besenrieder — Max-Planck-Institut für Physik, München

Silicon Photomultipliers (SiPMs) are attractive light detectors for high energy and astroparticle physics experiments. They are compact in size, have fast (few ns) response time, operate at lower voltage compared to classical photomultiplier tubes, are insensitive to magnetic fields, and offer photon detection efficiencies of > 40%. The optical cross-talk effect, whereby light emitted during the initial avalanche breakdown process may be absorbed by neighboring cells causing additional breakdowns, can degrade the measurement sensitivity of SiPMs. We describe ongoing work at the Max Planck Institute for Physics in Munich where we constructed a light emission microscopy setup to directly measure the emission due to optical cross-talk in SiPMs. We present an overview of our setup and measurements performed.