Würzburg 2018 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 81: Pixel-Detektoren III
T 81.1: Vortrag
Donnerstag, 22. März 2018, 16:30–16:45, Z6 - HS 0.002
Characterization of main production modules of the Pixel Vertex Detector for Belle II — •Philipp Leitl1, Felix Müller1, Christian Koffmane2, Philipp Wieduwilt3, and Harrison Schreeck3 — 1Max Planck Institute for Physics, Munich, Germany — 2Semiconductor Laboratory of the Max-Planck-Society, Munich, Germany — 3Georg-August-University, Göttingen, Germany
For the upgrade of the Belle detector at the electron positron collider SuperKEKB in Tsukuba, Japan, the vertexing system is completed by a new pixel detector. This Pixel Vertex Detector (PXD) is based on the Depleted P-channel Field-Effect Transistor (DEPFET) technology.
The PXD consists in total of 40 monolithic silicon modules which are cylindrically arranged around the interaction point in two layers. After a development and optimization period of several years the main production of the final detector modules run in 2017. The assembled modules were tested and characterized before they were joined to so called ladders and mechanically mounted to the support structure.
The testing procedure as well as an overview of the results is presented.