München 2019 – wissenschaftliches Programm

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K: Fachverband Kurzzeit- und angewandte Laserphysik

K 2: Light and Radiation Sources, EUV and X-Ray Sources

K 2.4: Vortrag

Dienstag, 19. März 2019, 12:00–12:20, HS 3

Relative timing jitter measurement at MHz Free Electron Lasers — •Michael Diez1,2, Andreas Galler1, Sebastian Schulz3, Wojciech Gawelda1,4, and Christian Bressler1,21European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany — 2he Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761 Hamburg,Germany — 3Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany — 4Faculty of Physics, Adam Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland

Free Electron Lasers (FELs) are capable of producing intense and ultrashort X-ray pulses, which enable various kinds of femtosecond time - resolved experiments. Achieving highest time resolution in optical pump / X-ray probe experiments, so called 'Timing Tools' are necessary to measure the relative arrival jitter between optical and X-ray pulse pairs [1]. We report on a novel approach which enables us to measure the relative arrival time with superior signal quality. Consequently we can now use samples such as diamond which could not be used so far, but is one of the few materials to withstand the full power of the new MHz high repetition rate XFEL facilities such as European XFEL and LCLS II. We show proof of principle measurements from LCLS and SACLA experiments and first MHz timing measurements from European XFEL. [1] Bionta, M. R. et al. Spectral encoding method for measuring the relative arrival time between x-ray/optical pulses. Review of Scientific Instruments 85, 083116 (11) (2014).

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