München 2019 – wissenschaftliches Programm
P 18.26: Poster
Donnerstag, 21. März 2019, 16:30–18:30, Foyer Audimax
Mie ellipsometry of optically thick nanodust clouds — •Nils Rehbehn1,2, Sebastian Wolf2, and Franko Greiner1 — 1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel — 2Institut für Theoretische Physik und Astrophysik, Christian-Albrechts-Universität zu Kiel
Mie ellipsometry, i.e., the analysis of light scattered by nanoparticles, is a standard technique for the in-situ size diagnostic of nanoparticles. It can be utilized to obtain information about these particles, like refractive index and grain size. However, its use is limited to optically thin clouds, as it is based on the assumption of single scattering. With increasing optical depth, thus increasing chance for multiple scattering, resulting in further modification of the polarization state, this method fails. Consequently, the analysis of optically thick systems is difficult or even impossible. To overcome this problem we performed radiative transfer simulations, taking the polarization state of the radiation as well as multiple scattering events into account.Our goal is to develop a new diagnostic method for systems of arbitrary optical depth, based on the analysis of the polarized state of the scattered radiation.