Regensburg 2019 – wissenschaftliches Programm
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HL: Fachverband Halbleiterphysik
HL 12: HL Poster I
HL 12.22: Poster
Montag, 1. April 2019, 17:30–20:00, Poster E
Investigation of mechanical properties of Carbon Nanomembrane using wrinkling based metrology — •Himanshu P. Patel1, Bernhard Alexander Glatz1, Maria Kuellmer2, Zian Tang2, Andreas Winter2, Andrey Turchanin2, and Andreas Fery1,3 — 1Leibniz-Institut für Polymerforschung Dresden e. V., Dresden, Germany — 2Friedrich Schiller University Jena, Institute of Physical Chemistry, Jena, Germany — 3Cluster of Excellence Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, Germany
We demonstrate further development in application of wrinkling-based metrology (SIEBIMM) to evaluate the Young's modulus and mechanical properties for 2D materials. In this case we have used Carbon Nanomembranes (CNMs), a 1nm thin 2D molecular material with known mechanical properties. This work addresses critical issues in the sample preparation for this method related to the adhesion of 2D films on the substrate and volumetric swelling of the substrate during removal of the protective PMMA layer used for transfer of various 2D materials. The optimized procedure results subsequently in an easy to apply system for deriving immediate first results on the mechanical properties of 2D materials produced and transferred using a similar technique. We show the improved transfer of 2D materials to PDMS and further formation of wrinkle by application of strain. The wrinkle pattern is studied in situ using atomic force microscopy (AFM). Calculations using the SIEBIMM formula confirm the values reported in literature before.