Regensburg 2019 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 6: Invited talk Bertram

HL 6.1: Invited Talk

Monday, April 1, 2019, 12:15–12:45, H33

Advanced nanoscale characterization of structural and optical properties of novel Nanostructures using scanning transmission electron microscopy cathodoluminescence — •Frank Bertram — Institut für Physik, Otto-von-Guericke-Universität Magdeburg

For a detailed understanding of complex semiconductor heterostructures and the physics of devices based on them, a systematic determination and correlation of the structural, chemical, electronic, and optical properties on a nanometer scale is essential. Luminescence techniques belong to the most sensitive, non-destructive methods of semiconductor research. The combination of luminescence spectroscopy,in particular at liquid He temperatures - with the high spatial resolution of a scanning transmission electron microscope (STEM) (dx < 1 nm at RT, dx < 5 nm at 10 K), as realized by the technique of low temperature scanning transmission electron microscopy cathodoluminescence microscopy (STEM-CL), provides a unique, extremely powerful tool for the optical nano-characterization of semiconductors, their heterostructures as well as their interfaces.