Regensburg 2019 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 51: Magnetism Poster B
MA 51.54: Poster
Donnerstag, 4. April 2019, 15:00–18:00, Poster C
Comparative investigation of the magnetic proximity effect by XRMR and XMCD and the influence of patterning — •Dominik Graulich1, Jan Krieft1, Anastasiia Moskaltsova1, Tristan Matalla-Wagner1, Tobias Pohlmann2,3, Joachim Wollschläger2, Sonia Francoual3, and Timo Kuschel1 — 1Center for Spineletronic Materials and Devices, Bielefeld University, Germany — 2Center of Physics and Chemistry of New Materials, Osnabrück University, Germany — 3Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany
X-ray resonant magnetic reflectivity (XRMR) is a very sensitive technique to detect the proximity-induced spin polarization in heterostructures of the heavy metal Pt in contact to ferromagnetic (FM) materials [1]. This synchrotron-based reflectivity technique is directly sensitive to the interfacial spin polarization, which makes it independent of the total Pt thickness in contrast to more common x-ray magnetic circular dichroism (XMCD) measurements. In addition, the XRMR analysis provides information on the spin depth profile of the induced spin polarization. In this study, we quantitatively compare the results of the XRMR and XMCD analysis for different Pt/FM bilayers. Furthermore, the influence of patterning the samples on the XRMR and XMCD results as well as on the validity of the current analysis procedure are investigated to explore non-equilibrium spin polarizations by XRMR in future work.
T. Kuschel et al., Phys. Rev. Lett. 115, 097401 (2015)