Regensburg 2019 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 9: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 9.1: Topical Talk
Montag, 1. April 2019, 15:45–16:15, H44
Scanning transmission electron microscopy as a multidimensional information channel with spatial, momentum and time resolution — •Knut Müller-Caspary1, Armand Beche2, Florian Winkler1, Florian Krause3, Daen Jannis2, Andreas Oelsner4, Heike Soltau5, Rafal Dunin-Borkowski1, Sandra Van Aert2, Johan Verbeeck2, and Andreas Rosenauer3 — 1Forschungszentrum Jülich (D) — 2EMAT Antwerpen (B) — 3Universität Bremen (D) — 4Surface Concept GmbH (D) — 5PN Detector GmbH (D)
With the advent of ultrafast cameras, methodologies in the field of Scanning Transmission Electron Microscopy experienced a rapid development in the past 5 years. Pixelated STEM now enables the simultaneous acquisition of real and reciprocal space data at unprecedented resolutions and samplings. The methodological framework to measure electric fields at atomic and unit cell scale is presented, based on a robust measurement of the momentum transferred to the STEM probe by the interaction with specimen. We show experimental results on charge density maps in 2D materials and polarisation fields in piezoelectric specimen. Momentum-resolved STEM is additionally discussed as to its potential for the in-situ mapping of electronic properties in electrically biased devices, and the chemical composition mapping via an angular multi-range analysis. Moreover, we report current approaches to enhance the time resolution of ultrafast detectors to the ps-scale, and outline the new opportunities a high sampling of the time domain provides for the characterisation of materials and processes.