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O: Fachverband Oberflächenphysik

O 72: Poster Wednesday: Scanning Probe Techniques

O 72.3: Poster

Mittwoch, 3. April 2019, 17:45–20:00, Poster B2

Analysis and quantification of electrochemical strain in contact resonance atomic force microscopy — •Sebastian Badur, Thomas Göddenhenrich, and André Schirmeisen — Institut für Angewandte Physik, Justus-Liebig-Universität Gießen, D-35392

Contact resonance atomic force microscopy can be used to measure the electrochemical strain caused by ionic movement (Vegard strain).

These potential-induced local surface deformations strongly depend on ionic concentration, electric field distribution and diffusion time. Besides that, local electrochemical strain response is mostly superimposed by other local tip-sample contact mechanics from local and non-local electrostatic forces that contribute to the image contrast formation.

For measuring and quantifying electrochemical strain, we developed a method to eliminate these parasitic contributions by using band excitation in a low and high frequency regime of the cantilever excitation.

As sample, we use LixCoO2 as a typical battery cathode material. Contact resonance measurements and additional current measurements were done with conductive cantilevers and tips under UHV condition.

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DPG-Physik > DPG-Verhandlungen > 2019 > Regensburg