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Mo, 16:15 |
MM 11.2 |
Characterization of Fe:STO thin films prepared by pulsed laser deposition — •Maximilian Morgenbesser, Stefanie Taibl, Markus Kubicek, Alexander Viernstein, Christopher Herzig, Andreas Limbeck, and Jürgen Fleig
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Mo, 16:30 |
MM 11.3 |
Generation of controlled dislocation structures in SrTiO3 and TiO2 for elucidating dislocation impact on electrical properties. — •Lukas Porz, Till Frömling, and Jürgen Rödel
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Mo, 17:30 |
MM 11.4 |
Atomic and electronic structure of wurtzite ZnO(0001) inversion domain boundaries — •Jochen Rohrer and Karsten Albe
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Mo, 17:45 |
MM 11.5 |
Impact of internal electric field on the grain boundary barrier height of ZnO — •Bai-Xiang Xu, Ziqi Zhou, and Till Frömling
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Mo, 18:00 |
MM 11.6 |
Influence of cation order and strain on Na diffusion in Na3Zr2Si2PO12: A computational study — •Lisette Haarmann and Karsten Albe
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Mo, 18:15 |
MM 11.7 |
The impact of mechanical stresses on the ionic conductivity of nanoparticles — •Peter Stein, Bai-Xiang Xu, and Karsten Albe
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Mo, 19:15 |
MM 12.1 |
Amorphous interlayers in semiconductor metallization — •Dennis König, Efi Hadjixenophontos, Guido Schmitz, and Kevin Treder
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Mo, 19:15 |
MM 12.2 |
Chemical bonding effects on the brittle-to-ductile transition in metallic glasses — •Franco Moitzi, Daniel Sopu, and Jürgen Eckert
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Mo, 19:15 |
MM 12.3 |
3D X-ray Diffraction Microscopy (3DXRD) using high resolution X-ray nanodiffraction — •Hergen Stieglitz, Christina Krywka, and Martin Müller
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Mo, 19:15 |
MM 12.4 |
Combining small-angle neutron scattering and analytical microscopy: An advanced method to characterize nanoprecipitates in Ni-based superalloys — •Robert Lawitzki, Ralph Gilles, Michael Hofmann, Julia Wagner, and Guido Schmitz
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4364
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437