Rostock 2019 – scientific programme
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Q: Fachverband Quantenoptik und Photonik
Q 38: Nano-Optics (Single Quantum Emitters) II
Q 38.1: Talk
Wednesday, March 13, 2019, 14:00–14:15, S SR 112 Maschb.
Towards a metrological characterization of semiconductor quantum dots for quantum radiometry in the near infrared — •Hristina Georgieva1, Marco López1, Beatrice Rodiek1, Helmuth Hofer1, Justus Christinck1, Peter Schnauber2, Tobias Heindel2, Sven Rodt2, Stephan Reitzenstein2, and Stefan Kück1 — 1Physikalisch-Technische Bundesanstalt, Braunschweig, Germany — 2Institut für Festkörperphysik, Technische Universität Berlin, Berlin, Germany
The range of possible implementations of single-photon sources in quantum information processing is rapidly growing. In order to achieve high accuracy and metrological traceability, we need reliable methods for their absolute characterization. Furthermore, single-photon emitters could be implemented as a standard source for the detection efficiency calibration of single-photon detectors. The precise measurement of small photon fluxes requires sources with high efficiency, narrow bandwidth and high single-photon purity. A promising candidate, which meets all these criteria, is an InGaAs quantum dot embedded in a deterministic photonic structure. We present measurements of the photon flux, the emission characteristics and the second-order correlation function of the InGaAs/GaAs single-photon source. The spectral filtering of the emission is realized by two bandpass filters, each having a full width at half maximum of 0.5 nm and a transmission of about 90 %. In contrast to the standard filtering method with a monochromator, our method reduces the photon losses, thus resulting in high count rates combined with high single-photon purity.