Hannover 2020 – wissenschaftliches Programm
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A 26.5: Vortrag
Donnerstag, 12. März 2020, 15:30–15:45, f107
Dispersive soft x-ray absorption fine-structure spectroscopy in graphite with an attosecond pulse — •Themistoklis P. H. Sidiropoulos1, Bárbara Buades1, Dooshaye Moonshiram2, Iker León1, Peter Schmidt1, Irina Pi1, Nicola Di Palo1, Seth L. Cousin1, Antonio Picón1, Frank Koppens1,3, and Jens Biegert1,3 — 1ICFO-Institut de Ciencies Fotoniques, 08860 Castelldefels, Spain — 2Institute of Chemical Research of Catalonia, 43007 Tarragona, Spain — 3ICREA, 08010 Barcelona, Spain
X-ray absorption fine-structure (XAFS) spectroscopy is a powerful element-specific technique, providing electronic and structural information with atomic resolution. Electronic information is extracted from the near-edge XAFS (NEXAFS) spectrum, requiring high spectral resolution to resolve features that occur within a few eV near the absorption edge. Structural information is obtained from the extended XAFS (EXAFS), spreading over several hundred eV above the absorption edge. While XANES and EXAFS are both well-established methods, crucially lacking so far is the capability to connect electronic with structural information in real-time. Here, we present a decisive step towards such new methodology based on water-window-covering (280 eV to 540 eV) attosecond soft X-ray pulses that can simultaneously access electronic and lattice parameters via dispersive XAFS spectroscopy. We validate this approach with an identification of the orbital contributions to the density of states in graphite simultaneously with the four characteristic bonding distances. This work demonstrates the potential of dispersive attosecond XAFS as a powerful spectroscopic tool.