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Q: Fachverband Quantenoptik und Photonik

Q 14: Precision Measurements and Metrology

Q 14.1: Vortrag

Dienstag, 10. März 2020, 11:00–11:15, a310

Entanglement Enhanced Quantum Interferometer — •Raphael Nold, Joel Schmidt, Tobias Linkewitz, Florian Kaiser, and Jörg Wrachtrup — 3. Physikalisches Institut Universität Stuttgart, Stuttgart, Germany

In metrology, interferometers are widely used for precision measurements. The sensitivity of interferometers with classical light is limited by the shot noise. To overcome this classical standard quantum limit one can make use quantum correlated particles. However, the associated detection schemes are generally very complex and slow. To overcome those issues, we present a nonlinear two-photon interferometer were photons pairs are produced by a PPKTP down converting crystal. By passing through this crystal two times we entangle two paths, which leads to interference in the signal-photon intensity (instead of the ordinary photon pair interference). We present our recent results consisting of an enhancement factor above 1.2 and sampling rates up to 20 kHz (enhancement factor of 8000 to comparable attempts [1]). As an application we make use of the measurement speed advantage to investigate the possibility of an entanglement enhanced quantum microscope for cell analysis and a quantum enhanced microphone for making the quantum effect audible.

[1] Ono, T. et al. Nature Communications 4, 2426 (2013)