DPG Phi
Verhandlungen
Verhandlungen
DPG

Dortmund 2021 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

T: Fachverband Teilchenphysik

T 60: Silicon Strip Detectors I

T 60.4: Vortrag

Mittwoch, 17. März 2021, 16:45–17:00, Tj

Testbeam studies of passive CMOS strip sensorsMarta Baselga1, Leena Diehl2, Ingrid-Maria Gregor1,3, Tomasz Hemperek3, Jan Cedric Hönig2, Ulrich Parzefall2, Arturo Rodriguez2, •Surabhi Sharma1, Dennis Sperlich2, Tianyang Wang3, and Liv Wiik-Fuchs21Deutsches Elektronen-Synchrotron DESY, Hamburg — 2Physikalisches Institut Albert-Ludwigs-Universität Freiburg, Freiburg im Breisgrau — 3Universität Bonn, Bonn, Germany

Future particle physics experiments are motivated by the increase in luminosity and thus the need for intelligent tracking detectors. The next generation tracking detectors are mostly all silicon detectors and thus finding a cost effective solution to maximise the output is important. A recent R&D project is using CMOS technology for silicon strip sensors, which allows large and high-resistive wafers at low cost, making them a prime candidate. Also since CMOS is the commercially fabricated process it provides the advantage of easier production. In this contribution, the test beam measurements at DESY test beam facilities of novel passive unirradiated CMOS silicon strip sensors developed by the ATLAS Collaboration are presented. The sensor is processed by LFoundry on a 150 µm thick wafer, employing a 150 nm CMOS technology and has three different strips design to study. The strip sensors are designed in two different lengths, formed by stitching of individual reticles. The main focus of this test beam measurement is to study the charge collection by the sensor and examine the performance of the stitching.

100% | Mobil-Ansicht | English Version | Kontakt/Impressum/Datenschutz
DPG-Physik > DPG-Verhandlungen > 2021 > Dortmund