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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 17: Poster Session I
CPP 17.59: Poster
Monday, March 27, 2023, 18:00–20:00, P3
From a Completely Different Angle: Exploring Twistronicsin Layered Materials with Atomic Force Microscopy — •Alexander Klasen1 and James Kerfoot2 — 1Park Systems Europe GmbH Schildkroetstrasse 15,68199 Mannheim, Germany — 2Park Systems UK Limited, MediCity Nottingham Thane Road NG90 8BH, Nottingham, UK
Single atomic layer-based systems emerged as a promising class of materials with unique optical, mechanical, and electronic properties that could provide a pathway to novel applications.1,2 Their two-dimensional nature gives rise to a wide range of tunability since their functional properties do not only depend on the type of atoms and bonds within one plane but also on the strain, local defects, and interplay between adjacent layers.3,4 Here, we present Atomic Force Microscopy (AFM) based approaches as an ideal toolbox to map various functional properties of 2D materials and heterostructures on a nanometer scale. More specifically, by deterministically breaking and re-stacking single flakes of layered materials, we form homostructures of both hexagonal boron nitride (hBN) and molybdenum disulfide (MoS2 ) Investigating ferroelectric superlattices on a hexagonal boron nitride bilayer on a graphene single layer, we can induce domain switching when applying a constant DC potential and study them via Piezoelectric Force Microscopy.5,6 We will show how conductive AFM (C-AFM) and Lateral Force Microscopy (LFM) allow imaging strain variations as distorted domains in both the current channel and the lateral force channel.