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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 35: Poster Session II

CPP 35.35: Poster

Wednesday, March 29, 2023, 11:00–13:00, P1

Transversal piezo-force-microscopy with the use of interdigitated electrodes — •Maximilian Litterst, Andrey Butkevich, and Martijn Kemerink — Institute for molecular systems engineering and advanced materials, Heidelberg, Germany

Piezoresponse force microscopy (PFM) is a simple method to measure the piezoelectric effect of many materials with an atomic force microscope (AFM). Usually, a voltage is applied between the tip and the substrate to trigger a vertical displacement of the material via the converse, longitudinal, piezoelectric effect, which results in a vertical displacement of the tip. The transversal piezoelectricity can result in a torsion of the tip, it is however often very difficult to find a direct connection between the two.

Here, we present how interdigitated electrodes (IDEs) can be used to apply an electric field in the film-plane, resulting in a vertical displacement of the film due to the converse, transversal, piezoelectric effect. In addition, the longitudinal component can be measured via the torsional tip motion. This does not only provide a direct way to measure the transverse piezoelectricity, but also opens new possibilities for the device preparation.