SKM 2023 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 14: Thin Oxides and Oxide Layers
DS 14.5: Vortrag
Donnerstag, 30. März 2023, 10:30–10:45, SCH A 315
Tungsten-oxide thin films characterized by Positron Annihilation Spectroscopy — •Vassily Vadimovitch Burwitz1, Annemarie Kärcher2,3, Lucian Mathes1, Thomas Schwarz-Selinger3, Maik Butterling4, Eric Hirschmann4, Maciej Oskar Liedke4, Andreas Wagner4, and Christoph Hugenschmidt1 — 1Heinz Maier-Leibnitz Zentrum, TU München — 2TU München — 3Max-Planck-Institut für Plasmaphysik, Garching bei München — 4Helmholtz-Zentrum Dresden-Rossendorf, Institute of Radiation Physics
For future nuclear fusion reactors it is foreseen that tungsten is used as inner wall cladding. Understanding the formation and behaviour of radiation induced defects in tungsten is therefore important for their safe operation. Tungsten mono-crystal model systems are studied by positron annihilation Doppler-broadening spectroscopy (DBS) and positron annihilation lifetime spectroscopy (PALS) to foster the understanding of the type and evolution of these defects. Both methods are sensitive tools when examining the defect type and concentration. However, data obtained by either of these methods is influenced by any thin oxide film on the surface of a sample. Such a film is present on any tungsten sample exposed to air, therefore its effect on DBS and PALS results needs to be known for their correct interpretation. In this work we measured tungsten-oxide thin films grown by thermal and electro-chemical methods as well as by exposure to air by DBS and PALS. The DBS measurements were performed using a moderated β+ emitter, the PALS measurements at an accelerator-based positron source.