SKM 2023 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 3: Organic Thin Films, Organic-Inorganic Interfaces (joint session DS/CPP)
DS 3.1: Vortrag
Montag, 27. März 2023, 11:30–11:45, SCH A 315
Thickness dependency of the critical dose for beam-sensitive two-dimensional polymers — •David Mücke1, Ute Kaiser1, and Haoyuan Qi1,2 — 1Central Facility of Material Science Electron Microscopy, Universität Ulm, 89081 Ulm, Germany — 2Center for Advancing Electronics Dresden (cfaed) & Faculty of Chemistry and Food Chemistry, Technische Universität Dresden, 01062 Dresden, Germany
For organic materials the achievable resolution in a TEM is limited by their resilience against electron irradiation. Due to that, increasing the critical dose of these sensitive materials is of highest importance. For layer stacked materials, where the thickness is easily controllable, the thickness dependency of the critical dose is a key feature. Aimed at gathering a better understanding of this effect, in our study this dependency was examined in more detail. To achieve this, the critical dose of a triazine-based 2D polymer[1] was measured for a wide thickness range. The polymer samples, obtained by mechanical exfoliation, ranged from 15 nm to 85 nm thickness. To obtain the critical dose of the polymer, sequences of electron diffraction patterns with a dose of only 0.5 e−/A2 where obtained. The measurements revealed, that the critical dose for amorphization of this polymer is only 1-2 e−/A2, independent of sample thickness.
References
1. F. Hu, et al. J. Am. Chem. Soc. 143, 5636-5642 (2021).