Parts | Days | Selection | Search | Updates | Downloads | Help
HL: Fachverband Halbleiterphysik
HL 7: Poster I
HL 7.31: Poster
Monday, March 27, 2023, 13:00–15:00, P2/EG
Graded ZnxMg1−xO layers as building blocks for ultra-compact wavemeters — Philipp Firme, •Christoph Brunhuber, Lukas Trefflich, Peter Schlupp, Daniel Splith, Holger von Wenckstern, Chris Sturm, and Marius Grundmann — Universität Leipzig, Felix Bloch Institute for Solid State Physics, 04103 Leipzig, Germany
Recently, a new design for a monolithic, ultra-compact wavemeter was proposed, which can be used in a wide spectral range [1]. The building blocks of this wavemeter are two vertically stacked, photosensitive layers, separated by a transparent, insulating layer. In order to achieve a spectral sensitivity, the top layer must consist of a material with a vertical absorption gradient. Here, we discuss the suitability of vertically graded ZnxMg1−xO layers as top layer of such an ultra-compact wavemeter with wurtzite photosensitive ZnO layer as backside. The layers were deposited by pulsed laser deposition, using a vertical continuous composition spread (VCCS-PLD) technique. In doing so, we were able to achieve out-of-plane composition gradients from x = 1.0 up to x ≈ 0.5 . XRD 2θ−ω-scans do not indicate a phase separation, and confirm the wurtzite phase. The Mg incorporation was also confirmed by photoluminescence spectroscopy. The suitability of the films as building blocks for the wavemeter was tested by photocurrent measurements. By radiation with monochromatic light of different wavelengths, a response similar to the theoretically calculated one [1] is obtained.
[1] M. Grundmann. Phys. Stat. Sol. A 215, 1800651 (2018)