SKM 2023 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 23: Poster Magnetism I
MA 23.39: Poster
Dienstag, 28. März 2023, 17:00–19:00, P1
Improvement of Magnetic Force Microscopy measurements using magnetics tips grown by Focused Electron Beam Induced Deposition — •A.T. Escalante-Quiceno1, V.V Fernández2, A. Hierro-Rodríguez2,3, J.I. Martín2,3, C. Magén1,4, and J.M De Teresa1,4 — 1Instituto de Nanociencia y Materiales de Aragón (INMA), CSIC-Universidad de Zaragoza, 50009 Zaragoza, Spain — 2Depto. Física, Universidad de Oviedo, 33007 Oviedo, Spain — 3CINN (CSIC-Universidad de Oviedo), 33940 El Entrego, Spain — 4Laboratorio de Microscopías Avanzadas (LMA), Universidad de Zaragoza, 50009 Zaragoza, Spain
We report the fabrication of magnetic tips for Magnetic Force Microscopy (MFM) using Focused Electron Beam Induced Deposition (FEBID). Due to their high aspect ratio and metallic content, these magnetic tips present a good magnetic behaviour, providing a number of advantages as lower non-magnetic tip-sample interaction, higher lateral resolution and higher coercivity than commercial magnetic tips when used for simultaneous topographical and magnetic measurements. A sharp tip apex with a diameter of 10 nm enables a high lateral resolution. Depending on the particular needs of the samples, the shape, length and diameter of the tip can be adjusted in a reproducible way. Because of its versatility, FEBID can produce magnetically hard tips customized with specific requirements. Ni80Fe20/NdCo5 bilayers with perpendicular magnetic anisotropy will be measured with FEBID-grown magnetic tips, where the resolution limit in MFM measurements will be tested.