SKM 2023 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 40: Poster Magnetism II
MA 40.40: Poster
Donnerstag, 30. März 2023, 14:00–16:00, P2/EG
Quantitative high sensitivity Magnetic Force Microscopy in vacuum — •Christopher Habenschaden1, Sibylle Sievers1, and Andrea Cerreta2 — 1Physikalisch-Technische Bundesanstalt, Braunschweig, Germany — 2Park Systems Europe GmbH, Mannheim, Germany
Magnetic Force Microscopy (MFM) allows the imaging of magnetic samples with spatial resolution of tens of nm and stray field resolution down to the mT range. However, it lacks comparability between measurements, which can be overcome by calibrating the tip, using a magnetic reference sample. This enables the calculation of sample stray fields in A/m, allowing quantitative MFM measurements.
Spatial resolution and field sensitivity can be pushed to several nm and the hundred uT range by measuring in vacuum conditions. This is due to the higher cantilever quality factors Q, that can be achieved in vacuum, directly leading to an increase in measurement signal. However, with increasing signal amplitude, non-linear behavior must be considered. Additionally, advanced feedback techniques are required for stable operation in vacuum.
Here we present an implementation by using phase-locked loops into a commercial Atomic Force Microscope (Park NX Hivac AFM), overcoming non-linearities in measurement signal. This allows stable, transfer function based, quantitative MFM also in vacuum. Advances in resolution and sensitivity are discussed and measurements on samples like skyrmion hosting multilayer stacks are shown and analyzed to demonstrate the feasibility of our measurement approach.