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MM: Fachverband Metall- und Materialphysik
MM 42: Interface Controlled Properties and Nanomaterials: Nanoporous Materials and Nanolaminates
MM 42.6: Vortrag
Donnerstag, 30. März 2023, 17:15–17:30, SCH A 215
Wetting and Drying Dynamics in Hierarchically Porous Silicon: An In-Situ X-Ray Microscopy Study — •Stella Gries1,2,3, Laura Gallardo Domínguez1,2,3, Mark Busch1,2,3, Mariia Liseanskaia1,2,3, Juan Sánchez Calzado1,2,3, Mathis Boderius1,2,3, Silja Flenner4, Imke Greving4, and Patrick Huber1,2,3 — 1Institute for Materials and X-Ray Physics, Hamburg University of Technology, Hamburg, Germany — 2Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany — 3Center for Hybrid Nanostructures CHyN, University of Hamburg, Hamburg, Germany — 4Institute of Materials Physics, Helmholtz Zentrum Hereon, Geesthacht, Germany
Hierarchical porosities consist of small, often nano-scaled pores as well as large, macroscopic pores to simultaneously achieve large inner surfaces in combination with optimized mass transport. The investigation of capillary dynamics within optically opaque hierarchically porous membranes necessitates sophisticated microscopy techniques. First hints to unveil the dynamics are obtained from lab-scale experiments, e.g. mass-uptake as a function of time or the mechanical response depending upon wetting and drying in dilatometry. However, these techniques do not spatially resolve on the rising liquid front, which is achieved with transmission X-ray microscopy (TXM). The samples are scanned in radiography (2D) and tomography (3D) to resolve both the static structure and the capillary dynamics. These findings can help to tailor hierarchical porous materials for their designated application and to tune the dynamics depending on the needs.