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O: Fachverband Oberflächenphysik
O 66: Poster: Scanning Probe Microscopy with Quartz Sensors
O 66.9: Poster
Wednesday, March 29, 2023, 18:00–20:00, P2/EG
Setup of a quartz needle sensor-based nc-AFM/STM operating at millikelvin temperatures — •Sven Just1,2, Taner Esat1,2, Denis Krylov1,2, Peter Coenen1,2,3, Vasily Cherepanov1,2,3, Bert Voigtländer1,2,3, Stefan Tautz1,2, and Ruslan Temirov1,2,4 — 1Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, Germany — 2Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology — 3mProbes GmbH, 52428 Jülich, Germany — 4Institute of Physics II, University of Cologne, 50937 Cologne, Germany
A non-contact (nc) atomic force microscope (AFM) is developed for operation in ultra-high vacuum at a base temperature of 300 mK. The AFM is based on an ultra-compact quartz needle sensor oscillating at 1 MHz with a 7.5 µ m thick tungsten tip glued to one end of the needle allowing for simultaneous operation of AFM and STM [1]. Nanopositioners with resistive readout and a scanner with a large low-temperature scan range of 30×30 µ m2 are used. Additionally, HF wiring for an antenna and a capillary for supply of gases, both close to the junction, are provided. The AFM setup is mounted on a removable insert (mK-stick) for usage in an existing millikelvin system based on adiabatic demagnetization refrigeration (ADR) [2]. Due to the modularity of the mK-sticks a quick exchange is possible without any need for warming up the LHe cryostat.
[1] I. Morawski et al., Rev. Sci. Instrum. 81, 033703 (2010)
[2] T. Esat et al., Rev. Sci. Instrum. 92, 063701 (2021)