SKM 2023 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 80: Plasmonics and Nanooptics IV: Light-Matter Interaction and Spectroscopy III

O 80.2: Vortrag

Donnerstag, 30. März 2023, 15:15–15:30, CHE 89

Lorentz Microscopy of Optical Fields — •John H. Gaida^1,2, Hugo Lourenço-Martins^1,2, Sergey V. Yalunin^1,2, Armin Feist^1,2, Murat Sivis^1,2, Thorsten Hohage³, F. Javier García de Abajo^4,5, and Claus Ropers^1,2 — ¹MPI for Multidisciplinary Sciences, Göttingen, Germany — ²4th Physical Institute, University of Göttingen, Germany — ³Institute of Numerical and Applied Mathematics, University of Göttingen, Germany — ⁴ICFO-Institut de Ciencies Fotoniques, Castelldefels (Barcelona), Spain — ⁵ICREA-Institució Catalana de Recerca i Estudis Avançats, Barcelona, Spain

In electron microscopy, detailed insights into nanoscale optical properties of materials are gained by spontaneous inelastic scattering leading to electron-energy loss and cathodoluminescence. Photon-induced near-field electron microscopy (PINEM) allows for mode- and polarization-selective imaging based on stimulated scattering in the presence of external sample excitation. Through this process a spatial phase profile inherited from the optical fields is imprinted onto the wave function of the probing electrons. Here, we introduce Lorentz-PINEM for the full-field, non-invasive imaging of complex optical near fields at high spatial resolution. We use energy-filtered defocus phase-contrast imaging and iterative phase retrieval to reconstruct the phase distribution of interfering surface-bound modes on a plasmonic nanotip. Our approach is universally applicable to retrieve the spatial phase of nanoscale fields and topological modes.

[1] John H. Gaida, et al., 2022, Preprint at Research Square doi.org/10.21203/rs.3.rs-2150760/v1.