Quantum 2025 – wissenschaftliches Programm

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WED-ID: Industry Day

WED-ID 4: Quantum Sensing & Metrology

WED-ID 4.5: Hauptvortrag

Mittwoch, 10. September 2025, 16:25–16:45, ZHG007

Accelerating semiconductor developments with Quantum Metrology — •Mathieu Munsch — Qnami, Basel, Switzerland

The rapid advancement of generative AI is driving unprecedented demand for high-performance, energy-efficient semiconductor devices. This shift places enormous pressure on both memory and compute technologies, exacerbating challenges such as the memory wall and pushing the limits of conventional architectures. Emerging solutions including 2D materials, neuromorphic processing units, and quantum processing units are now being explored alongside traditional CPUs and GPUs to meet these requirements.

In this evolving landscape, the need for precise, high-resolution data to guide and accelerate development is more critical than ever. Conventional test tools are reaching their limits in sensitivity and spatial resolution, especially in heterogeneous and quantum-class devices. To address this, we introduce a new class of test solutions based on quantum sensors. These tools offer unprecedented precision and are compatible with a wide range of operating environments, from cryogenic conditions to ambient settings.

Our presentation will demonstrate how quantum metrology enables deeper insights into device behavior at the nanoscale, delivering actionable information that helps our customers explore the cutting edge of science and accelerate R&D cycles. We will highlight case studies where quantum sensing provided a unique advantage, paving the way for the next era of semiconductor innovation

Keywords: Semiconductor; Spintronics; 2D materials; NV centers; Metrology