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DS: Fachverband Dünne Schichten
DS 20: Poster
DS 20.41: Poster
Donnerstag, 12. März 2026, 18:30–20:30, P2
Hard X-Ray Momentum Microscope Measurements of SrCoOx Thin Films at Beamline P22 — •Volkmar Koller, Sourav Chowdhury, Sergii Chernov, Andrei Gloskovskii, and Christoph Schlueter — Photon Science | DESY Hamburg
Emerging memory devices are a possibility to reduce electricity expenditure in the future compared to established complementary metal-oxide-semiconductors CMOS. For instance the Mottronic is based on a topotactic phase transition TPT associated with a metal-insulator transition MIT, instead of a manipulation of charges like in semiconductors. This might allow a further miniaturization of devices.
Here we show the Hard X-Ray Momentum Microscope HarMoMic at the beamline P22 of the PETRA III synchrotron at DESY as tool to monitor the electronic and crystalline structure of materials showing a TPT. Based on Hard X-ray Photoelectron Spectroscopy HAXPES the HarMoMic probes angle resolved the bulk electronic structure of single crystalline samples. Thus, the electronic band structure and X-ray photoelectron diffraction patterns XPD can be measured. From the XPD patterns the crystalline structure of a material can be determined by comparing it to simulations (Kikuchi Diffraction patterns).
As model system we show measurements of SrCoOx(001) thin films grown via PLD on Nb-doped SrTiO3(001). Upon the application of an electric bias it is electrochemically oxidized from SrCoO2.5 (BrownMillerite, insulator, antiferromagnetic) to SrCoO3−δ (Perovskite-like, metallic, ferromagnetic) undergoing a TPT.
Keywords: HAXPES; Topotactic Phase Transition; SCO; Momentum Microscope; operando