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09:30 |
DS 21.1 |
From Semiconductors to Quantum Materials: Ultrafast Optical Signatures Across Chalcogenide Classes — •Timo Veslin, Felix Hoff, Jonathan Frank, and Matthias Wuttig
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09:45 |
DS 21.2 |
Orientation-Dependent Near-Field Infrared Properties of a Chiral SURMOF — •Nadine von Coelln, Ana C. Fingolo, Benedikt Zerulla, Marjan Krstić, Christian Huck, Carsten Rockstuhl, Christof Wöll, and Petra Tegeder
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10:00 |
DS 21.3 |
Pressure-dependent photoluminescence and Raman spectra of GeSn alloys — •Stefan Zollner, Sonam Yadav, Meghan A. Worrell, Preston T. Webster, Rigo A. Carrasco, and Perry C. Grant
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10:15 |
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15 min. break
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10:30 |
DS 21.4 |
VIPR: A Modular Machine Learning Framework for Inverse Problems with Application to Reflectometry — •Sascha Creutzburg, Jeyhun Rustamov, Alexandros Koutsioumpas, Jens Bornschein, Marina Ganeva, Stefan Häusler, Bernd Helm, Alexander Hinderhofer, Mykhailo Levytskyi, Valentin Munteanu, Robert Juzak, Vedhas Pandit, Frank Schreiber, Jeffrey Kelling, and Nico Mothes
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10:45 |
DS 21.5 |
Spectroscopic Imaging Ellipsometry at Cryogenic Temperatures: Uncovering a Structural Phase Change in 2D Polar Ga — •Jakob Henz, Arpit Jain, Joshua A. Robinson, Su Y. Quek, and Ursula Wurstbauer
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11:00 |
DS 21.6 |
Adsorption-Driven Vibrational and Electronic Changes on Cu(110) — •Sarang Bhasme, Mariella Denk, and Peter Zeppenfeld
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11:15 |
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15 min. break
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11:30 |
DS 21.7 |
Refining the Tanguy dispersion model for strong direct interband interactions — •Beáta Hroncová and Stefan Zollner
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11:45 |
DS 21.8 |
A Novel Characterization Tool for Optical Coatings and Thin Films — •Fabian Felixberger, Ayesha Khan, Jonathan Noé, Michael Förg, Manuel Nutz, Simone Strohmair, Ines Amersdorffer, David Hunger, Theodor Hänsch, and Thomas Hümmer
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12:00 |
DS 21.9 |
Measuring sub-nanometer oscillations of a thin gold film by a combination of ultrafast imaging ellipsometry and interferometry — •Markus Olbrich, Theo Pflug, Andy Engel, Andrés Lasagni, and Alexander Horn
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12:15 |
DS 21.10 |
Long-term studies of the defect types in tritiated graphene using Raman microscopy — •Genrich Zeller, Magnus Schlösser, and Helmut H. Telle
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