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DS: Fachverband Dünne Schichten
DS 21: Optical Analysis of Thin Films
DS 21.2: Talk
Friday, March 13, 2026, 09:45–10:00, REC/C213
Orientation-Dependent Near-Field Infrared Properties of a Chiral SURMOF — •Nadine von Coelln1, Ana C. Fingolo2, Benedikt Zerulla3, Marjan Krstić4, Christian Huck1, Carsten Rockstuhl3,4, Christof Wöll2, and Petra Tegeder1 — 1Institute for Physical Chemistry, Heidelberg University, Germany — 2Institute of Functional Interfaces — 3Institute of Nanotechnology — 4Institute of Theoretical Solid State Physics, Karlsruhe Institute of Technology, Germany
Chiral surface-anchored metal organic frameworks (SURMOFs) are promising candidates for enantioselective separation, molecular sensing and optoelectronic applications with circularly polarized light. Given the large possible design space, it is highly important to understand their spectral response and to be able to predictively model SURMOF structures to determine interesting candidates for experimental screening. In this work, we employ infrared scanning near-field optical microscopy (IR-SNOM) to probe anisotropic infrared properties. Crystallites with two distinct molecular orientations exhibited pronounced differences in their near-field infrared spectra. A controlled manipulation of crystal orientation confirmed that molecular orientation is the origin of these spectral differences. A multi-scale modeling approach, spanning single MOF unit cell simulations to thin-film Maxwell scattering calculations, was validated as it reproduced the spectral signatures and strong orientation sensitivity of the material [1].
[1] A. Fingolo, N. von Coelln et al., Adv. Funct. Mater. e24088 (2025).
Keywords: Scanning Probe Microscopy; Infrared; SURMOF; Molecular Orientation