Dresden 2026 – scientific programme
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DS: Fachverband Dünne Schichten
DS 21: Optical Analysis of Thin Films
DS 21.8: Talk
Friday, March 13, 2026, 11:45–12:00, REC/C213
A Novel Characterization Tool for Optical Coatings and Thin Films — •Fabian Felixberger1,2, Ayesha Khan1,3, Jonathan Noé1, Michael Förg1, Manuel Nutz1, Simone Strohmair1, Ines Amersdorffer1,3, David Hunger3, Theodor Hänsch2, and Thomas Hümmer1 — 1Qlibri GmbH, Munich — 2Ludwig Maximilian University of Munich — 3Karlsruhe Institute of Technology
Thin films and nanostructured surfaces play a crucial role in modern science and technology, with their applications ranging from optical components to biosensors. Their precise characterization is therefore essential for understanding and optimizing their function.
We show that inserting such materials in an optical resonator [1] offers a platform which allows the investigation of minimal amounts of scattering and absorption. In addition, it can be utilised for the detection of defects, deviations from surface flatness and local changes of the refractive index.
By raster-scanning the sample, we obtain spatially resolved maps that allow us to distinguish between point-like defects and extended surface features.
Our results prove that we have developed a versatile and open-access tool for non-destructive and quantitative analysis of optical coatings and thin films, suitable for a wide range of materials.
[1] T. Hümmer et al., Nat Commun. 7, 12155 (2016)
Keywords: Thin Films; Optical Coating; Characterization; Absorption; Imaging