Dresden 2026 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 3: Thin Film Properties I: Methods

DS 3.2: Vortrag

Montag, 9. März 2026, 15:15–15:30, REC/C213

The TXPES Beamline at SESAME: A New Facility for Advanced Soft X-ray Photoelectron Spectroscopy — •Zeynep Reyhan Ozturk — TARLA, Ankara, Turkey — SESAME, Balqa, Jordan

The TXPES (Turkish X-ray Photoelectron Spectroscopy) beamline at SESAME is a newly installed soft X-ray facility dedicated to high-resolution XPS, UPS, and ARPES for advanced surface and interface analysis. With a broad tunable photon-energy range, TXPES enables detailed investigation of electronic structure, chemical composition, band dispersion, and oxidation states in a wide variety of materials.

The end station features a multi-chamber UHV system including a preparation chamber, an analysis chamber, and a high-pressure cell for in situ and near-ambient pressure studies. The analysis chamber houses a hemispherical electron energy analyzer capable of XPS/UPS/ARPES, along with an ion gun, LEED, and LEIS, enabling comprehensive structural and chemical characterization at different depth sensitivities. TXPES combines tunable soft X-rays, high-resolution electron spectroscopy, and controlled environments to study surface oxidation, adsorption, catalysis, thin-film interfaces, and electronic band alignment with exceptional sensitivity. The integration of a high-pressure cell expands these investigations to realistic gas conditions, bridging the gap between model systems and real-world applications. The beamline represents a major collaborative effort between Turkish institutions and SESAME and is progressing toward full operation and user access in the near future.

Keywords: xps; surface sensıtıve; ups; leed; arpes