Dresden 2026 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 3: Thin Film Properties I: Methods
DS 3.4: Vortrag
Montag, 9. März 2026, 15:45–16:00, REC/C213
Simulation-Guided GIXPS: How to Maximize Signal and Depth Sensitivity in Photoelectron Emission Experiments — •O. Rehm1, E. Kusari1, D. Capalbo1, A. Gloskovskii2, C. Schlueter2, L. Baumgarten3, and M. Müller1 — 1Fachbereich Physik, Universität Konstanz, 78457 Konstanz — 2DESY, 22607 Hamburg — 3FZ Jülich GmbH, PGI-6, 52425 Jülich
(Hard) X-ray Photoelectron Spectroscopy ((HA)XPS) is a powerful technique for probing the chemical and electronic structure of thin films, interfaces, and multilayers, but access to synchrotron radiation is typically highly limited. To address this constraint, we present a simulation-guided approach that optimizes (HA)XPS experiments through grazing-incidence (GI) geometries. At GI angles (0.3∘-2∘) refraction and total reflection of X-rays generate pronounced angle-dependent interference effects that shift the weighted contribution maximum of photoelectrons to well-defined depths within the sample. Our approach - GIXPS - predicts these conditions in advance, enabling targeted enhancement of surface, interface, or bulk sensitivity. It boosts photoemission intensity by up to two orders of magnitude at characteristic GI angles, enabling faster data acquisition and better depth resolution while preserving the element-specificity of (HA)XPS. This methodology provides a practical route to more efficient, depth-selective experiments and is a powerful tool for designing and carrying out optimized interface- and bulk-sensitive (HA)XPS measurements - thus enabling the more efficient use of limited synchrotron beamtime. O. Rehm et al.
Keywords: GIXPS; Grazing-incidence X-ray photoelectron spectroscopy; XPS; HAXPES; Interface