Dresden 2026 – wissenschaftliches Programm
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FM: Fachverband Funktionsmaterialien
FM 11: Poster Session Functional Materials
FM 11.7: Poster
Dienstag, 10. März 2026, 18:00–20:30, P4
Topology and Bonding: A bonding-based approach to topological insulators via Atom Probe Tomography — •Elias Hildebrand1, Jan Köttgen2, Yuan Yu1, and Matthias Wuttig1,2 — 1I. Institute of Physics (IA), RWTH Aachen University, Germany — 2Peter Grünberg Institute - JARA-Institute Energy Efficient Information Technology (PGI-10), Jülich, Germany
Ever since the discovery of the quantum Hall effect, interest in topological phases of matter has steadily increased. Initially attributed to spin-orbit coupling, the underlying guiding principle causing these topological phases of matter has been a topic of ongoing discussion.
Here, we want to propose a bonding-based approach to explain nontrivial topological states. The experimental foundation for this connection is established through Atom Probe Tomography (APT). While APT is primarily employed for microstructural analysis, it has recently been proposed as a tool capable of identifying different bonding mechanisms.
Within this method, most topologically nontrivial materials also exhibit distinct bond-breaking behaviour corresponding to their characteristic bonding mechanisms. Here, different materials are investigated regarding their topological nature and behaviour in the APT.
Consequently, APT can be established as an experimental method for identifying topological phases of matter and as an empirical argument highlighting the significance of bonding in understanding the fundamental principles governing topological materials.
Keywords: Atom Probe Tomography; topological insulators; topological semimetals; chemical bonding