Dresden 2026 – wissenschaftliches Programm
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FM: Fachverband Funktionsmaterialien
FM 19: Advanced Microscopy and Tomography for Functional Materials
FM 19.2: Vortrag
Donnerstag, 12. März 2026, 10:30–10:45, BEY/0E40
X-ray Stress Tensor Tomography — •Peter Modregger1,2, Ahmar Khaliq1,2, and Felix Wittwer1,2 — 1Physics Department, University of Siegen — 2Center for X-ray and Nano science, CXNS, DESY, Hamburg
The possibility for tomographic reconstrution of strain and stress tensor present in poly-crystalline samples has been discussed for nearly two decades. We will demonstrate the successful retrieval of all 6 strain/stress tensor components in martensitic steel samples from experimental data acquired at the ID11 beamline of the ESRF. Compared to established techniques this novel approach for the depth-resolved determination of stress states offers the tantalizing advantages of a simple experimental setup, isotropic gauge volumes and faster scans. In our presentation, we will discuss the possible adverse effects of detector parallax and crystallographic texture. Further, we will provide specific experimental requirements such as the required photon flux or the available scattering angles. With these in mind, we have achieved a strain sensitivity of 10−4 and a stress sensitivity of 20 MPa.
Keywords: x-ray powder diffraction; residual stress; tomography; iterative reconstruction; stress tensor