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HL: Fachverband Halbleiterphysik
HL 1: Optical Properties I
HL 1.12: Vortrag
Montag, 9. März 2026, 12:30–12:45, POT/0006
Focused Ion Beam (FIB) patterned Microcavities for Topological Lasers — •Lorenz Löffler1,4, Dominik Horneber1,4, Jakob Lindenthal2,4, Johannes Düreth1,4, Markas Sudzius2,4, Monika Emmerling1, Martin Kamp3, Simon Betzold1,4, Johannes Benduhn2,4, Sven Höfling1,4, Karl Leo2,4, and Sebastian Klembt1,4 — 1University of Würzburg, Physikalisches Institut, Lehrstuhl für Technische Physik — 2Dresden Integrated Center for Applied Physics and Photonic Materials (IAPP), and Institute of Applied Physics, Technische Universität Dresden — 3University of Würzburg, Physikalisches Institut and Wilhelm-Conrad-Röntgen-Research Center for Complex Material Systems — 4Würzburg-Dresden Cluster of Excellence ct.qmat
Topological lasers can be realized by coupling individual photonic resonators in topologically non-trivial lattice geometries. Optical microcavities have been found to be a promising platform for studying topological laser interfaces with long-range coherence. The fabrication of such structures typically involves etching of the microcavity and through the emitter layer. In our work, we create the photonic potential by FIB milling of a glass substrate prior to depositing dielectric Bragg reflectors. This technique allows the potential to be engineered while keeping the emitter layer intact. Here, the emitter is either semiconductor quantum wells or the organic semiconductor Alq3 doped with DCM dye. By exploring modified lattice geometries that enhance the interface-to-bulk ratio as well as temperature-dependent studies, we aim for the next step towards practical topological lasers.
Keywords: Topological photonics; Microcavity lattices; Topological lasing