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MA: Fachverband Magnetismus
MA 56: Focus Session: (Anti)ferroic states – Magnetic and magnetoelectric III (joint session FM/MA)
MA 56.4: Vortrag
Freitag, 13. März 2026, 10:45–11:00, BEY/0E40
Resolving the chemical depth profile of ultrathin EuO films by grazing incidence HAXPES measurements — •Katharina Wehrstein1, Umut Parlak1, Pia Düring1, Oliver Rehm1, Andrei Gloskovskii2, Christoph Schlueter2, and Martina Müller1 — 1FB Physik, Uni Konstanz — 2DESY, Hamburg
Magnetic proximity effects enable control of magnetic order in ferromagnetic insulators without altering their intrinsic properties. Europium oxide (EuO) thin films coupled with heavy metals (HM) are promising systems for spintronic applications, in which spin-polarized states are induced, altered or converted via interface coupling. These systems require a sharp interface between the metal and the EuO layer, as well as stoichiometric EuO. As ferromagnetic Eu(II)O is metastable and tends to oxidize to paramagnetic Eu(III)2O3, investigating the depth-resolved chemical and thus magnetic nature of an EuO layer is mandatory to observe and eventually tune magnetic proximity effects.
Ultrathin EuO films (2-15 nm) were prepared by molecular beam epitaxy on Pt/SrTiO3 and W/SrTiO3 substrates. Grazing incidence hard X-ray photoelectron spectroscopy (GIXPES) enables high X-ray intensity at the sample surface due to reflection of the X-ray beam on the heavy metal layer, leading to the formation of X-ray standing waves. By changing the incidence angle of the X-ray beam, spectra with modulated depth-sensitivity were recorded, revealing variations in the Eu3+ content at different depths of the ultrathin EuO layer. This yields a chemical depth profile and thus a magnetic profile that provides insight into the magnetic behavior of the EuO/HM system.
Keywords: EuO; HAXPES; Photoelectron Spectroscopy; Depth Profiling; Proximity Effect