Dresden 2026 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 7: Poster Magnetism I
MA 7.79: Poster
Montag, 9. März 2026, 09:30–12:30, P2
Accessing in-plane stray field components with torsional resonance mode magnetic force microscopy — •Jorge Marqués-Marchán1, José Claudio Corsaletti Filho1, Pamela Morales-Fernández1, and Claire Donnelly1,2 — 1MPI CPfS, Dresden, Germany — 2WPI-SKCM2, Hiroshima, Japan
In recent years, the emergence of 3D nanomagnetism and topological configurations has highlighted the importance of mapping the 3D vector field components in these systems. A lab-based technique that could provide such contrast is torsional resonance mode magnetic force microscopy (TR-MFM), where the MFM probe oscillates laterally with respect to the sample surface. Although MFM is a well-established technique, the use of TR-MFM has only been validated on standard samples [1,2]. Here, we use TR-MFM in combination with standard MFM to map both the in-plane and out-of-plane stray field components of different samples, aiding the understanding of different 3D magnetic configurations.
[1] A. Kaidatzis and J. M. García-Martín, Nanotechnology 24, 165704 (2013)
[2] J. F. Schmidt et al., J. Appl. Phys. 136, 113904 (2024)
Keywords: magnetic force microscopy; 3D nanomagnetism; torsional resonance mode