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O: Fachverband Oberflächenphysik

O 19: Vacuum Science & Technology: Theory and Applications – Poster

O 19.10: Poster

Montag, 9. März 2026, 18:00–20:00, P2

Electronoptical Concept of ARPES and RIXS Combined in a Novel Photoelectron Microscope — O. Tkach¹, Y. Lytvynenko¹, C. Fawaz², T. Lacmann³, S. Chernov⁴, O. Fedchenko^1,5, H. Agarwal¹, M. Hoesch⁴, J. K. Dey⁴, J. Dilling^4,6, L. Bruckmeier^4,6, M. Scholz⁴, J. Schunck^4,7, S. Roth², K. Rossnagel^4,6, M. Beye⁸, M. Le Tacon², •G. Schönhense¹, and H.-J. Elmers¹ — ¹Univ., Mainz — ²IQMT, KIT — ³EPFL, Switzerland — ⁴DESY, Hamburg — ⁵Goethe Univ. Frankfurt — ⁶CAU Kiel — ⁷Univ. Hamburg — ⁸AlbaNova, Sweden

The instrumentation required for ARPES and Resonant Inelastic X-ray Spectroscopy (RIXS) is usually completely different. ARPES uses electron spectrometers, primarily hemispherical ones, whereas RIXS requires high-resolution X-ray spectrometers with long optical paths to achieve the desired resolution. In a special time-of-flight photoelectron microscope, we combined photoelectron momentum microscopy (MM) - imaging of the backfocal plane of the objective lens, a powerful ARPES approach - with the concept of PAXRIXS [1]. Here, the RIXS photons are converted into photoelectrons using an ultrathin foil. The position at which a RIXS photon hit the converter is a measure for the momentum transfer. For RIXS, the converter foil is moved between the sample and the extractor with fields-of-view of >4 mm. This is facilitated by a novel type of front lens which enables various operating modes. Ultrathin Au, Ag, and Pt converter foils provide energy resolutions between 20 meV and 400 meV.

[1] Dakovski et al., J. Synchrotron Radiat. 24 (2017) 1180.

Keywords: RIXS; ARPES; Momentum microscopy; XPEEM