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O: Fachverband Oberflächenphysik

O 44: Scanning probe techniques: Method development – Poster

O 44.10: Poster

Dienstag, 10. März 2026, 14:00–16:00, P2

Development of a Low-Temperature Scanning Probe Microscope — •Tingwen Miao — Tsung-Dao Lee Institute, Shanghai, China

We independently designed and constructed a low-temperature ultrahigh-vacuum scanning probe microscope (SPM) system which is equipped with a single-axis 9T magnetic field and can be cooled down to 400mK. The system integrates the functionalities of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) into the scanning head, enabling in-situ measurements of both electrical signals and force signals. The cooling curve, current noise, non-contact AFM and STM imaging and I(V) spectroscopy are characterized to verify that the system achieve the fundamental SPM capabilities. Subsequent magnetic field test and low-temperature test will be performed to confirm that the system can achieve all designed performance.

Keywords: Scanning probe microscope; cooling technology; data acquisition; atomic force microscopy; scanning tunneling microscopy