Dresden 2026 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 44: Scanning probe techniques: Method development – Poster
O 44.12: Poster
Dienstag, 10. März 2026, 14:00–16:00, P2
Distance dependent of local work function on Pb/Si(111) islands — •Ajay Kumar2, Thomas Späth1, Ben Lottenburger2, Zeineb Ben Tanfous3, Daniel Rothhardt2,4, Paul P. Schmidt2, Manuel Schulze2, Ralf Metzler2, Kurt Busch3, Gino Wegner3,5, and Regina Hoffmann-Vogel2 — 1Institute of Physics and Astronomy, University of Potsdam, Karl-Liebknecht-Str. 24-25, 14476, Potsdam, Germany — 2Physikalisches Institute, Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany — 3Humboldt University of Berlin, 12489 Berlin, Germany — 4Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland — 5Max-Born-Institute, 12489 Berlin, Germany
A quantitative description of the measured local contact potential difference (LCPD) as a function of tip-sample separation is essential for a deeper understanding of Kelvin probe force microscopy (KPFM), since it permits a more complete characterization of the sample's electronic properties and of the forces acting on the probe. We employ Pb islands on the Si(111)-7*7 reconstruction as a model system of metallic islands on a semiconducting substrate. Using a frequency-modulation scanning force microscope, we have performed frequency-shift bias-approach measurements at 115 K on these Pb islands and have studied the variation of the LCPD with tip-sample distance.
Keywords: Scanning probe microscopy; Atomic force microscopy