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14:00 |
O 44.1 |
Determining the electrical transmission to the junction of a scanning tunneling microscope — •Guido Hiller, Gaël Reecht, and Manuel Gruber
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14:00 |
O 44.2 |
Upgrading an LT-STM with a qPlus-AFM system — •René Knispel, Patrick Härtl, and Matthias Bode
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14:00 |
O 44.3 |
Multifrequency Tunnelling Spectroscopy — •Gleb Neplyakh, Philipp E.J. Maier, Carolina A. Marques, Berk Zengin, Kevin Hauser, Rian Ligthart, Alexander LaFleur, and Fabian D. Natterer
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14:00 |
O 44.4 |
Tip-enhanced Raman Microscopy simulation methods — •Pablo Planelles Prensa, Harshit Sethi, Orlando Silveira Junior, and Adam Foster
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14:00 |
O 44.5 |
Automatic tip functionalization with CO on Ag(111) using machine learning — •Johanna Schnorrenberg, Jonas Heggemann, Paul Laubrock, and Philipp Rahe
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14:00 |
O 44.6 |
Spectral interferometry scanning near-field optical microscopy; investigating resonant tip-sample near-field interactions — •Tom Jehle, Sam S. Nochowitz, Juanmei Duan, and Christoph Lienau
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14:00 |
O 44.7 |
Cryogenic Band Pass Amplifier for measuring Atomic Shot Noise — •Benjamin Frölich, Kevin Hauser, Lebin Yu, Gleb Neplyakh, Ajla Karić, and Fabian D. Natterer
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14:00 |
O 44.8 |
all-in-one preparation stage of STM/AFM QPlus sensors for ultrahigh vacuum — •reza habibipour, jakob pelster, marco pratzer, michiel reul, and markus morgenstern
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14:00 |
O 44.9 |
Iron Implantation from a Ferrocene Ion Source — •Urs Boison, Ajla Karić, Berk Zengin, Lebin Yu, and Fabian D. Natterer
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14:00 |
O 44.10 |
Development of a Low-Temperature Scanning Probe Microscope — •Tingwen Miao
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14:00 |
O 44.11 |
Correlative AFM-SEM-EDS microscopy on nanoparticles and -wires — Chris Schwalb, •Lukas Stühn, Hajo Frerichs, Sebastian Seibert, Darshit Jangid, Marion Wolff, Kerim Arat, Hamed Alemansur, Afshin Alipour, Andreas Amann, Luis Montes, Jost Diederichs, Jeff Gardiner, Will Neils, and Stefano Spagna
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14:00 |
O 44.12 |
Distance dependent of local work function on Pb/Si(111) islands — •Ajay Kumar, Thomas Späth, Ben Lottenburger, Zeineb Ben Tanfous, Daniel Rothhardt, Paul P. Schmidt, Manuel Schulze, Ralf Metzler, Kurt Busch, Gino Wegner, and Regina Hoffmann-Vogel
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14:00 |
O 44.13 |
Nonlinearity mapping using adaptive control schemes in scanning force microscopy — •Lukas Böttcher, Hannes Wallner, Niklas Kruse, Franziska Dorn, Wolfram Just, Ingo Barke, Jens Starke, and Sylvia Speller
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14:00 |
O 44.14 |
Realizing Spin-Polarized Scanning Tunneling Microscopy for an Atomic-Scale Study — •Leon Bojunga, Felix Otto, Jonas Brandhoff, Maximilian Schaal, Christian Haberland, Lorenz Brill, and Torsten Fritz
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14:00 |
O 44.15 |
Low latency, galvanically isolated data transfer architecture for distributed low-level precision measurements — Toni Marković, Shane O'Neill, Aitziber Herrero, David Zurbriggen, Daniel Uehli, and •Alessandro Pioda
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14:00 |
O 44.16 |
Development of low noise cryogenic circuitry for shot noise measurements in STM — •Anne-Catherine Oeter, Soumyaranjan Jhankar, Christian Ast, and Klaus Kern
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14:00 |
O 44.17 |
Realization of laser-assisted UHV sample surface preparation for STM — •Clara Marie Nieder, Soumyaranjan Jhankar, David Sousa, and Christian Ast
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